Eric Demey
1Patents
1h-index
4Co-inventors
25Inventor score
Filing activity: Nov 17, 2017 → Nov 17, 2017
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10496506B2 | Self-test capable integrated circuit apparatus and method of self-testing an integrated circuit | Electricity | 3 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.