Etsuko Asano
12Patents
2h-index
18Co-inventors
47Inventor score
Filing activity: Apr 11, 2003 → Aug 28, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7521368B2 | Method for manufacturing semiconductor device | Electricity | 25 | Expired |
| US7231310B2 | Method for evaluating semiconductor device | Physics | 3 | Expired |
| US7292955B2 | Method and apparatus for examining semiconductor apparatus and method for designing semiconductor apparatus | Physics | 2 | Expired |
| US7256079B2 | Evaluation method using a TEG, a method of manufacturing a semiconductor device having a TEG, an element substrate and a panel having the TEG, a program for controlling dosage and a computer-readable recording medium recoding the program | Electricity | 2 | Expired |
| US7112982B2 | Method for evaluating semiconductor device | Physics | 2 | Expired |
| US7567882B2 | Method for evaluating semiconductor device | Physics | 1 | Active |
| US8114719B2 | Memory device and manufacturing method of the same | Electricity | 1 | Active |
| US8822272B2 | Semiconductor device, manufacturing method thereof, and measuring method thereof | Electricity | 0 | Active |
| US7202149B2 | Semiconductor device and manufacturing method thereof | Electricity | 0 | Expired |
| US7714367B2 | Semiconductor device and manufacturing method thereof | Electricity | 0 | Active |
| US7560293B2 | Evaluation method using a TEG, a method of manufacturing a semiconductor device having the TEG, an element substrate and a panel having the TEG, a program for controlling dosage and a computer-readable recording medium recording the program | Electricity | 0 | Active |
| US9261554B2 | Semiconductor device, manufacturing method thereof, and measuring method thereof | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.