Francesca Canali
2Patents
2h-index
7Co-inventors
27Inventor score
Filing activity: Jun 29, 1999 → Sep 28, 1999
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6233046A | Method of measuring the thickness of a layer of silicon damaged by plasma etching | Physics | 12 | Expired |
| US6313040A | Process for the definition of openings in a dielectric layer | Electricity | 4 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.