Frank Heinlein
2Patents
2h-index
6Co-inventors
27Inventor score
Filing activity: May 3, 2001 → Aug 2, 2001
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6365423B1 | Method of inspecting a depth of an opening of a dielectric material layer | Physics | 14 | Expired |
| US6720242B2 | Method of forming a substrate contact in a field effect transistor formed over a buried insulator layer | Electricity | 9 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.