Friedhelm Caspers
2Patents
2h-index
1Co-inventors
24Inventor score
Filing activity: Feb 25, 1982 → Sep 7, 1982
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4492915A | Method and apparatus for the electronic measurement of the thickness of very thin electrically conductive films on a nonconductive substrate | Physics | 19 | Expired |
| US4520308A | Process and device for the nondestructive measurement of material accumulations or coating thicknesses on dielectric materials, in particular plastic | Physics | 13 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.