Fudong Guo
1Patents
1h-index
4Co-inventors
25Inventor score
Filing activity: Dec 31, 2015 → Dec 31, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9658114B1 | Device for measuring point diffraction interferometric wavefront aberration and method for detecting wave aberration | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.