Gary Devries
2Patents
1h-index
5Co-inventors
30Inventor score
Filing activity: Apr 5, 2006 → Apr 8, 2009
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7433057B2 | Method for accurate high-resolution measurements of aspheric surfaces | Physics | 5 | Active |
| US8203719B2 | Stitching of near-nulled subaperture measurements | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.