Georg Goecke
1Patents
1h-index
4Co-inventors
25Inventor score
Filing activity: Dec 2, 2008 → Dec 2, 2008
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8180142B2 | Test fail analysis on VLSI chips | Physics | 2 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.