Gordon Doering
3Patents
1h-index
12Co-inventors
37Inventor score
Filing activity: Jan 21, 2005 → Feb 2, 2010
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7301646B2 | Device and method for the determination of imaging errors and microlithography projection exposure system | Physics | 8 | Expired |
| US7760345B2 | Method and apparatus for determining at least one optical property of an imaging optical system | Physics | 1 | Active |
| US8228483B2 | Projection objective for microlithography, projection exposure apparatus, projection exposure method and optical correction plate | Emerging Cross-Sectional Technologies | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.