Guy Kafry
1Patents
0h-index
4Co-inventors
19Inventor score
Filing activity: Jul 12, 2016 → Jul 12, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10215707B2 | System for inspecting a backside of a wafer | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.