Hahn Joo YOON
1Patents
0h-index
4Co-inventors
19Inventor score
Filing activity: Oct 21, 2021 → Oct 21, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11774370B2 | Apparatus for processing substrate and method for measuring temperature of substrate | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.