Hans Hermann Pieper
5Patents
1h-index
5Co-inventors
36Inventor score
Filing activity: Mar 10, 2017 → Jun 13, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9995764B2 | Method and apparatus for avoiding damage when analysing a sample surface with a scanning probe microscope | Physics | 1 | Active |
| US11429020B2 | Method and apparatus for removing a particle from a photolithographic mask | Physics | 0 | Active |
| US11899359B2 | Method and apparatus for removing a particle from a photolithographic mask | Physics | 0 | Active |
| US11977097B2 | Methods and devices for extending a time period until changing a measuring tip of a scanning probe microscope | Electricity | 0 | Active |
| US11353478B2 | Methods and devices for extending a time period until changing a measuring tip of a scanning probe microscope | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.