Hans J. Hansen
10Patents
6h-index
18Co-inventors
59Inventor score
Filing activity: Jun 17, 1993 → Oct 7, 2008
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5479252A | Laser imaging system for inspection and analysis of sub-micron particles | Physics | 220 | Expired |
| US5963314A | Laser imaging system for inspection and analysis of sub-micron particles | Physics | 165 | Expired |
| US6414752B1 | Method and apparatus for scanning, stitching, and damping measurements of a double-sided metrology inspection tool | Physics | 18 | Expired |
| US7782452B2 | Systems and method for simultaneously inspecting a specimen with two distinct channels | Physics | 12 | Active |
| US7009696B2 | Method and apparatus for scanning, stitching, and damping measurements of a double-sided metrology inspection tool | Physics | 8 | Expired |
| US5504630A | Beam steering apparatus | Physics | 6 | Expired |
| US6686996B2 | Method and apparatus for scanning, stitching, and damping measurements of a double-sided metrology inspection tool | Physics | 2 | Expired |
| US6924082B1 | Double-bond shifts of substituted (4n)-annulenes for information storage and data processing | Emerging Cross-Sectional Technologies | 1 | Expired |
| US7663746B2 | Method and apparatus for scanning, stitching and damping measurements of a double sided metrology inspection tool | Physics | 0 | Active |
| US7436506B2 | Method and apparatus for scanning, stitching, and damping measurements of a double-sided metrology inspection tool | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.