Harsanjeet Singh
4Patents
2h-index
10Co-inventors
37Inventor score
Filing activity: Aug 13, 2004 → Apr 16, 2013
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7209851B2 | Method and structure to develop a test program for semiconductor integrated circuits | Physics | 32 | Expired |
| US8255198B2 | Method and structure to develop a test program for semiconductor integrated circuits | Physics | 9 | Active |
| US9785542B2 | Implementing edit and update functionality within a development environment used to compile test plans for automated semiconductor device testing | Physics | 2 | Active |
| US9274911B2 | Using shared pins in a concurrent test execution environment | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.