Using shared pins in a concurrent test execution environment

US9274911B2 · kind B2 · utility

Assignee

• ADVANTEST CORPORATION · JP

Inventors

• Mark Elston · San Jose, US
• Harsanjeet Singh · Danville, US
• Ankan Pramanick · San Jose, US
• Leon Chen · San Jose, US
• Hironori Maeda · Utsunomiya, JP
• Chandra Pinjala · San Jose, US
• Ramachandran Krishnaswamy · Cupertino, US

Key dates

• Filing date: Feb 21, 2013
• Grant date: Mar 1, 2016
• Expiry date: Nov 11, 2033

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/31908
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A method for using shared pins in a concurrent test execution environment is disclosed. The method relates to scheduling tests in concurrently executing test flows for automated test equipment (ATE) in a way so that resources can be shared between the test flows. The method comprises determining if any of a plurality of splits used by a first test contains at least one resource that is shared, wherein the first test and a second test are sequenced for execution in two separate concurrently executing test flows. The method further comprises determining if the first test should execute before the second test if the split is associated with resources required by both the second and first tests. Finally the method comprises reserving the split containing the at least one shared resource for access by the first test before beginning execution of the first test.