Heejune Lee
3Patents
0h-index
11Co-inventors
28Inventor score
Filing activity: Sep 2, 2021 → Feb 28, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11698410B2 | Semiconductor integrated circuit and method of testing the same | Electricity | 0 | Active |
| US11867757B2 | Built-in self-test circuits and semiconductor integrated circuits including the same | Electricity | 0 | Active |
| US12057844B2 | Digital droop detector, semiconductor device including the same, and calibration method thereof | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.