Himanshu
1Patents
1h-index
2Co-inventors
22Inventor score
Filing activity: Apr 18, 2019 → Apr 18, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10802077B1 | Test circuit for dynamic checking for faults on functional and BIST clock paths to memory in both ATPG and LBIST modes | Physics | 6 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.