Hubert Werkmann
2Patents
0h-index
4Co-inventors
24Inventor score
Filing activity: Oct 30, 2020 → May 13, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11782072B2 | Test arrangement for testing high-frequency components, particularly silicon photonics devices under test | Physics | 0 | Active |
| US11561242B2 | Test arrangement for testing high-frequency components, particularly silicon photonics devices under test | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.