Hyundo RYU
1Patents
0h-index
8Co-inventors
19Inventor score
Filing activity: Jul 16, 2021 → Jul 16, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11709196B2 | Method and apparatus for detecting circuit defects | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.