Method and apparatus for detecting circuit defects
US11709196B2 · kind B2 · utility
0Cited by
2References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 16, 2021 |
| Grant date | Jul 25, 2023 |
| Priority date | — |
| Expiry date | Sep 2, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/203
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The disclosure relates to an RFIC apparatus, and more particularly, to an RFIC circuit having a test circuit, a test apparatus, and a test method thereof. Further, the disclosure relates to a method for estimating or determining a DC gain using a test apparatus and an RF circuit in a DC/AC test stage, and detecting defects of the RF circuit based on the estimated or determined DC gain.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.