Hyunmin Kwon
2Patents
0h-index
4Co-inventors
21Inventor score
Filing activity: Jan 19, 2021 → Jul 8, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11614483B2 | Test apparatus for testing semiconductor packages and automatic test equipment having the same | Physics | 0 | Active |
| US11860083B2 | Apparatus and method of testing an object within a dry gas environment | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.