I Cheng Tseng
1Patents
1h-index
5Co-inventors
25Inventor score
Filing activity: Jan 30, 2004 → Jan 30, 2004
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7306746B2 | Critical dimension control in a semiconductor fabrication process | Electricity | 5 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.