Iwan W. Schie
1Patents
1h-index
2Co-inventors
22Inventor score
Filing activity: Mar 17, 2017 → Mar 17, 2017
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11599738B2 | Method for examining distributed objects by segmenting an overview image | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.