Method for examining distributed objects by segmenting an overview image
US11599738B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 17, 2017 |
| Grant date | Mar 7, 2023 |
| Priority date | — |
| Expiry date | Sep 26, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30024
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Method for examining a multiplicity of distributed objects (1) by using an overview image (200) of the area (2) in which the objects (1) are distributed, wherein the overview image (200) is converted (110) into a binary image (210) by virtue of the intensity values (202) of the pixels (201) of the overview image (200) being classified (202a, 202b) as to whether they are on the near or far side of a prescribed threshold (208); the binary image (210) is cleared (120) of structures (219) that are smaller than the objects (1), so that a cleared image (220) is produced; and the cleared image (220) is morphologically closed (130), so that a binary object mask (230) is produced that indicates which locations in the area (2) belong to objects (1) and which locations in the area (2) do not belong to an object. A computer program product, including a machine-readable program having instructions that, when the program is executed on a computer, prompt the computer and any measuring apparatus connected thereto to perform the method according to the invention.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.