Jae-Sun Cho
2Patents
2h-index
7Co-inventors
27Inventor score
Filing activity: Nov 30, 2004 → Jul 13, 2005
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7339663B2 | Method and apparatus for classifying repetitive defects on a substrate | Physics | 3 | Expired |
| US7155366B2 | Apparatus and method for inspecting patterns on wafers | Physics | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.