James M. Kaku
3Patents
1h-index
10Co-inventors
37Inventor score
Filing activity: Jun 25, 1997 → Mar 4, 2002
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5881068A | Decode register with scan functionality | Physics | 6 | Expired |
| US6596563B2 | Method for double-layer implementation of metal options in an integrated chip for efficient silicon debug | Electricity | 1 | Expired |
| US6396149B1 | Method for double-layer implementation of metal options in an integrated chip for efficient silicon debug | Electricity | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.