Jan Ten Broke
1Patents
1h-index
3Co-inventors
25Inventor score
Filing activity: Aug 17, 2000 → Aug 17, 2000
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6256243A | Test circuit for testing a digital semiconductor circuit configuration | Physics | 8 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.