Jan Van Olmen
2Patents
2h-index
8Co-inventors
33Inventor score
Filing activity: Oct 2, 1998 → Apr 10, 2006
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6136619A | Method for measuring electromigration-induced resistance changes | Physics | 9 | Expired |
| US7611986B2 | Dual damascene patterning method | Electricity | 2 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.