Jan Wichmann
1Patents
1h-index
1Co-inventors
22Inventor score
Filing activity: Nov 21, 1996 → Nov 21, 1996
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5731588A | Process and device for optically measuring a point on a sample with high local resolution | Physics | 84 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.