Inventor · Talence, FR

Jean-Baptiste Sibarita

4Patents
2h-index
5Co-inventors
30Inventor score

Filing activity: Jan 15, 2013 → Jul 17, 2015

Most-cited inventions

PatentTitleAreaCited byStatus
US10115013B2 Method and apparatus for single-particle localization using wavelet analysis Physics 6 Active
US9117273B2 Method and apparatus for single-particle localization using wavelet analysis Physics 4 Active
US10031326B2 System and method of edge-illumination microscopy Physics 1 Active
US10668468B2 Micro-textured surface with integrated micro-mirrors for 3D multi-scale microscopy Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.