System and method of edge-illumination microscopy
US10031326B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Aug 27, 2014 |
| Grant date | Jul 24, 2018 |
| Priority date | — |
| Expiry date | Aug 27, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/10
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
According to one aspect, the invention concerns a method for microscopy of a thick sample arranged on a sample support, with edge-illumination of the sample. The method comprises, in particular, emitting at least one illumination beam (1), forming, from the illumination beam, an illumination surface, focusing the illumination surface in the sample by means of a microscope lens (120) and deflecting the illumination surface originating from the microscope lens, in order to form a transverse illumination surface, located in a plane substantially perpendicular to the optical axis of the microscope lens. The method further comprises forming, by means of said microscope lens (120), the image of an area of the sample illuminated by the transverse illumination surface on a detection surface (131) of a detection device (130), scanning the illumination beam, allowing the transverse illumination surface to move along the optical axis of the microscope lens, and superimposing the object imaging surface and the transverse illumination surface, by focusing means comprising means separate from the means for the relative axial movement of the microscope lens and the sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.