Jeff Engel
3Patents
3h-index
12Co-inventors
51Inventor score
Filing activity: Apr 5, 1994 → Sep 30, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5471482A | VLSI embedded RAM test | Physics | 51 | Expired |
| US5475815A | Built-in-self-test scheme for testing multiple memory elements | Physics | 27 | Expired |
| US9628279B2 | Protecting application secrets from operating system attacks | Physics | 4 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.