Jeff Wight
2Patents
2h-index
8Co-inventors
30Inventor score
Filing activity: Sep 6, 1996 → Dec 29, 1999
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6477674B1 | Method and apparatus for conducting input/output loop back tests using a local pattern generator and delay elements | Physics | 60 | Expired |
| US5862373A | Pad cells for a 2/N mode clocking scheme | Physics | 22 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.