Ji-Seong Doh
4Patents
2h-index
14Co-inventors
41Inventor score
Filing activity: Jan 26, 2007 → May 12, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7617065B2 | Methodology for estimating statistical distribution characteristics of physical parameters of semiconductor device | Physics | 2 | Active |
| US8356271B2 | Layout testing method and wafer manufacturing method | Electricity | 2 | Active |
| US12182490B2 | Semiconductor design automation system and computing system including the same | Physics | 0 | Active |
| US11687696B2 | Semiconductor design automation system and computing system including the same | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.