Jien Cao
1Patents
0h-index
7Co-inventors
19Inventor score
Filing activity: Mar 11, 2013 → Mar 11, 2013
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8934091B2 | Monitoring incident beam position in a wafer inspection system | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.