Jimmy Yen
1Patents
1h-index
4Co-inventors
25Inventor score
Filing activity: Apr 4, 2007 → Apr 4, 2007
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7982479B2 | Inspection methods for defects in electrophoretic display and related devices | Physics | 96 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.