Inspection methods for defects in electrophoretic display and related devices
US7982479B2 · kind B2 · utility
96Cited by
19References
10Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 4, 2007 |
| Grant date | Jul 19, 2011 |
| Priority date | — |
| Expiry date | Sep 19, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G3/344
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
The present invention relates to methods for inspection of defects in an electrophoretic display and related devices. The method may be carried out with one or more testing electrodes. The method comprises applying a voltage difference to two testing electrodes which are in contact with the display panel, or applying a voltage difference to a testing electrode and a electrode layer. The methods may be applied in in-line or off-line inspection of a display panel.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.