Jin-Yeol Yang
4Patents
2h-index
11Co-inventors
37Inventor score
Filing activity: Jan 20, 2012 → Nov 14, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9500599B2 | Surface inspection apparatus for semiconductor chips | Physics | 4 | Active |
| US9488567B2 | Pipe damage detection apparatus and method | Physics | 2 | Active |
| US10504804B2 | Laser processing method, substrate dicing method and substrate processing system for performing the same | Electricity | 0 | Active |
| US11004754B2 | X-ray topographic apparatus and substrate processing system using the apparatus | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.