Jingheng Wei
1Patents
1h-index
1Co-inventors
22Inventor score
Filing activity: Nov 27, 2012 → Nov 27, 2012
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8560992B2 | Method for inspecting a chip layout | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.