Jiwon Yeom
2Patents
0h-index
8Co-inventors
21Inventor score
Filing activity: Apr 15, 2022 → Aug 1, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US12385946B2 | Method of inspecting tip of atomic force microscope and method of manufacturing semiconductor device | Electricity | 0 | Active |
| US12092656B2 | Test apparatus and test method thereof | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.