John Mark Oonk
4Patents
3h-index
2Co-inventors
36Inventor score
Filing activity: Jan 29, 1999 → May 31, 2006
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6202186A | Integrated circuit tester having pattern generator controlled data bus | Physics | 24 | Expired |
| US6862703B2 | Apparatus for testing memories with redundant storage elements | Physics | 12 | Expired |
| US6380730B1 | Integrated circuit tester having a program status memory | Physics | 11 | Expired |
| US7492181B1 | Method and device for enabling the measurement of device under test voltages using a testing instrument of limited range | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.