Inventor · Thousand Oaks, CA, US

Jonathan Hops

2Patents
1h-index
6Co-inventors
30Inventor score

Filing activity: Jun 26, 2003 → Oct 25, 2005

Most-cited inventions

PatentTitleAreaCited byStatus
US7216273B2 Method for testing non-deterministic device data Physics 13 Expired
US7509226B2 Apparatus and method for testing non-deterministic device data Electricity 1 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.