Apparatus and method for testing non-deterministic device data
US7509226B2 · kind B2 · utility
1Cited by
4References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 25, 2005 |
| Grant date | Mar 24, 2009 |
| Priority date | — |
| Expiry date | Oct 29, 2025 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L43/50
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and system is provided for detecting and correcting non-deterministic data that provides substantially real-time validation results and maximizes flexibility for the device manufacturer while reducing test costs. The automatic test apparatus and method can correct non-determinism caused by cycle slipping at the beginning of data transmission, between packets of data being transmitted and out-of-order data types of non-determinism. A data validation circuit is coupled to the receiver for validating the packet data based on expected packet data stored in a vector memory.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.