Jong H. Han
2Patents
2h-index
4Co-inventors
33Inventor score
Filing activity: Oct 13, 1999 → Aug 31, 2007
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6259265A | Unified test system and method for testing printed circuit boards | Physics | 17 | Expired |
| US7752916B2 | Apparatus and method for material testing of microscale and nanoscale samples | Physics | 11 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.