Juinn Lee
1Patents
1h-index
3Co-inventors
25Inventor score
Filing activity: Mar 31, 2003 → Mar 31, 2003
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7076707B2 | Methodology of locating faults of scan chains in logic integrated circuits | Physics | 3 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.