Jun Lang
6Patents
2h-index
16Co-inventors
40Inventor score
Filing activity: Jan 2, 2013 → Mar 18, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9053527B2 | Detecting defects on a wafer | Physics | 63 | Active |
| US9984889B2 | Techniques for manipulating patterned features using ions | Electricity | 8 | Active |
| US10381232B2 | Techniques for manipulating patterned features using ions | Electricity | 1 | Active |
| US11347758B2 | Method and apparatus for processing search data | Physics | 0 | Active |
| US11741072B2 | Method and apparatus for real-time interactive recommendation | Physics | 0 | Active |
| US10635678B2 | Method and apparatus for processing search data | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.