Jun YE
1Patents
1h-index
6Co-inventors
25Inventor score
Filing activity: Sep 25, 2012 → Sep 25, 2012
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8711349B2 | High throughput thin film characterization and defect detection | Physics | 7 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.