Jung-Lan Lee
1Patents
1h-index
6Co-inventors
25Inventor score
Filing activity: Jul 13, 2005 → Jul 13, 2005
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7339663B2 | Method and apparatus for classifying repetitive defects on a substrate | Physics | 3 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.