Junwei Wei
3Patents
2h-index
9Co-inventors
30Inventor score
Filing activity: Jun 24, 2015 → Jun 18, 2017
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9709510B2 | Determining a configuration for an optical element positioned in a collection aperture during wafer inspection | Physics | 15 | Active |
| US10082470B2 | Defect marking for semiconductor wafer inspection | Physics | 6 | Active |
| US10215713B2 | Determining a configuration for an optical element positioned in a collection aperture during wafer inspection | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.