Justin Lach
2Patents
0h-index
10Co-inventors
25Inventor score
Filing activity: Jun 4, 2021 → Apr 28, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US12332182B2 | System for automatic diagnostics and monitoring of semiconductor defect die screening performance through overlay of defect and electrical test data | Physics | 0 | Active |
| US12422376B2 | Imaging reflectometry for inline screening | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.